DocumentCode :
1323073
Title :
Direct-Reading Method for Nonlinearity Index of Silicon Carbide Varistor
Author :
Uno, Masami ; Tanaka, Hiroyuki
Author_Institution :
Faculty of Engineering, Shizuoka University, Hamamatsu, Japan.
Issue :
1
fYear :
1971
Firstpage :
64
Lastpage :
66
Abstract :
This paper presents a direct-reading method for the nonlinearity index of silicon carbide varistor. Varistors of voltage rated from 50 V to 700 V can be measured without range switching. Measurement is made either at 0.1 and 1 mA or 1 and 10 mA of the varistor current. Precalibration is made by using an ordinary resistor. Measurement accuracy is -3 percent.
Keywords :
Current measurement; Indexes; Silicon carbide; Time measurement; Varistors; Voltage measurement; Voltmeters;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1971.5570744
Filename :
5570744
Link To Document :
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