• DocumentCode
    132309
  • Title

    Feasibility and performances of BOOST converter in automotive application using silicon power transistors operating at 200°C

  • Author

    Roder, Robert ; Azzopardi, Stephane ; Le Henaff, Francois ; Briat, Olivier ; Vinassa, J.M. ; Bontemps, Serge

  • Author_Institution
    IMS Lab., Univ. of Bordeaux, Talence, France
  • fYear
    2014
  • fDate
    16-20 March 2014
  • Firstpage
    182
  • Lastpage
    190
  • Abstract
    This study presents the capability to use conventional silicon power semiconductor devices (Si-IGBT, Si-CoolMOS™) at 200°C operating junction temperature in a BOOST converter for traction automotive application. For each die, nano-scale silver sintered die-attach has been used in order to guaranty an optimum heat transfer between the chip and the substrate. Electrical static characterizations (breakdown voltage, leakage current, threshold voltage and on-state voltage drop) as well as dynamic characteristics (turn-on, turn-off and switching losses) have been investigated for a wide range of temperature (from -50°C up to 200°C). A comparison is made with a SiC-MOSFET taken as reference. Additionally, as a preliminary study, each device is tested in a 200V to 450V @200W (power scale reduction) BOOST converter to evaluate its performances and its use at 200°C.
  • Keywords
    automotive electronics; elemental semiconductors; heat transfer; microassembling; power convertors; power transistors; silicon; Si; SiC-MOSFET; boost converter; electrical static characterizations; nanoscale silver sintered die-attach; optimum heat transfer; power 200 W; silicon power semiconductor devices; silicon power transistors; temperature -50 degC to 200 degC; temperature 200 degC; traction automotive application; voltage 200 V to 450 V; Breakdown voltage; Junctions; Leakage currents; Temperature; Temperature measurement; Temperature sensors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • Type

    conf

  • DOI
    10.1109/APEC.2014.6803307
  • Filename
    6803307