DocumentCode
1323309
Title
High T0(140 K) and low-threshold long-wavelength strained quantum well lasers on InGaAs ternary substrates
Author
Otsubo, K. ; Shoji, H. ; Kusunoki, T. ; Suzuki, T. ; Uchida, T. ; Nishjima, Y. ; Nakajima, K. ; Ishikawa, H.
Author_Institution
RWCP Opt. Interconnection Fujitsu Lab., Atsugi, Japan
Volume
33
Issue
21
fYear
1997
fDate
10/9/1997 12:00:00 AM
Firstpage
1795
Lastpage
1797
Abstract
InGaAs-InAlGaAs strained quantum well lasers emitting in the 1.2 μm region have been fabricated on In0.22Ga0.78As ternary substrates. The threshold current density of the laser with highly reflective facets is 176 A/cm 2 at 20°C. The characteristic temperature (T0) of the device has reached 140 K, which is the highest value ever reported for long-wavelength semiconductor lasers
Keywords
III-V semiconductors; aluminium compounds; current density; gallium arsenide; indium compounds; laser transitions; quantum well lasers; 1.2 micron; 140 K; In0.22Ga0.78As; InGaAs ternary substrates; InGaAs-InAlGaAs; high characteristic temperature; highly reflective facets; long-wavelength laser; low-threshold operation; semiconductor lasers; strained quantum well lasers; threshold current density;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19971238
Filename
633399
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