DocumentCode :
1323519
Title :
Improved Efficiency by Using Transparent Contact Layers in InGaN-Based p-i-n Solar Cells
Author :
Shim, Jae-Phil ; Jeon, Seong-Ran ; Jeong, Yon-Kil ; Lee, Dong-Seon
Author_Institution :
Sch. of Inf. & Commun., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
Volume :
31
Issue :
10
fYear :
2010
Firstpage :
1140
Lastpage :
1142
Abstract :
InGaN/GaN p-i-n solar cells were fabricated either without a current spreading layer or with ITO or Ni/Au spreading layers. A 10.8% indium composition was confirmed within an i-InGaN layer using X-ray diffraction. I-V characteristics were measured at AM1.5 conditions, with solar cell parameters being obtained based on I-V curves in all cases. Current spreading layers produced strong effects on efficiency. The solar cell with the ITO current spreading layer showed the best results, i.e., a short circuit current density of 0.644 mA/cm2, an open circuit voltage of 2.0 V, a fill factor of 79.5%, a peak external quantum efficiency of 74.1%, and a conversion efficiency of 1.0%.
Keywords :
III-V semiconductors; X-ray diffraction; gallium compounds; indium compounds; p-i-n diodes; solar cells; InGaN-GaN; X-ray diffraction; current spreading layers; efficiency 1 percent; efficiency 74.1 percent; p-i-n solar cells; transparent contact layers; voltage 2 V; Absorption; Gallium nitride; Gold; Indium tin oxide; Nickel; Photonic band gap; Photovoltaic cells; Efficiency; Indium Gallium Nitride (InGaN) solar cell; spreading layer;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2010.2058087
Filename :
5570890
Link To Document :
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