DocumentCode
1323690
Title
Results From Testing of 145 3D Position-Sensitive, Pixelated CdZnTe Detectors
Author
Boucher, Yvan A. ; Jaworski, Jason ; Kaye, Willy ; Zhang, Feng ; He, Zhong
Author_Institution
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Volume
59
Issue
6
fYear
2012
Firstpage
3332
Lastpage
3338
Abstract
Testing of 20 × 20 × 15 mm3 3D position sensitive, CdZnTe detectors grown by Redlen Technologies Inc. has shown that 98 out of the 145 detectors analyzed achieved sub-1% FWHM at 662 keV for single-pixel events. Improvements in the detector performance over time reflect the improvements in detector growth and fabrication over the past several years. In addition to the spectroscopic performance of the detectors, the imaging performance of each detector was also quantified. The results show that imaging is weakly correlated to the spectroscopic performance, and more strongly correlated to the accuracy of the depth reconstruction. Other detector issues such as gain deficit and gain variation are also discussed.
Keywords
position sensitive particle detectors; semiconductor counters; wide band gap semiconductors; 3D position-sensitive detectors; Redlen Technologies Inc; detector fabrication; detector growth; detector imaging performance; detector performance; detector spectroscopic performance; gain deficit; gain variation; pixelated CdZnTe detectors; single-pixel events; Energy resolution; Gamma ray detectors; Semiconductor radiation detectors; Wide band gap semiconductors; Gamma ray detectors; semiconductor radiation detectors; wide-band gap semiconductors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2218829
Filename
6334457
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