• DocumentCode
    1323690
  • Title

    Results From Testing of 145 3D Position-Sensitive, Pixelated CdZnTe Detectors

  • Author

    Boucher, Yvan A. ; Jaworski, Jason ; Kaye, Willy ; Zhang, Feng ; He, Zhong

  • Author_Institution
    Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    59
  • Issue
    6
  • fYear
    2012
  • Firstpage
    3332
  • Lastpage
    3338
  • Abstract
    Testing of 20 × 20 × 15 mm3 3D position sensitive, CdZnTe detectors grown by Redlen Technologies Inc. has shown that 98 out of the 145 detectors analyzed achieved sub-1% FWHM at 662 keV for single-pixel events. Improvements in the detector performance over time reflect the improvements in detector growth and fabrication over the past several years. In addition to the spectroscopic performance of the detectors, the imaging performance of each detector was also quantified. The results show that imaging is weakly correlated to the spectroscopic performance, and more strongly correlated to the accuracy of the depth reconstruction. Other detector issues such as gain deficit and gain variation are also discussed.
  • Keywords
    position sensitive particle detectors; semiconductor counters; wide band gap semiconductors; 3D position-sensitive detectors; Redlen Technologies Inc; detector fabrication; detector growth; detector imaging performance; detector performance; detector spectroscopic performance; gain deficit; gain variation; pixelated CdZnTe detectors; single-pixel events; Energy resolution; Gamma ray detectors; Semiconductor radiation detectors; Wide band gap semiconductors; Gamma ray detectors; semiconductor radiation detectors; wide-band gap semiconductors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2218829
  • Filename
    6334457