DocumentCode :
1323690
Title :
Results From Testing of 145 3D Position-Sensitive, Pixelated CdZnTe Detectors
Author :
Boucher, Yvan A. ; Jaworski, Jason ; Kaye, Willy ; Zhang, Feng ; He, Zhong
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Volume :
59
Issue :
6
fYear :
2012
Firstpage :
3332
Lastpage :
3338
Abstract :
Testing of 20 × 20 × 15 mm3 3D position sensitive, CdZnTe detectors grown by Redlen Technologies Inc. has shown that 98 out of the 145 detectors analyzed achieved sub-1% FWHM at 662 keV for single-pixel events. Improvements in the detector performance over time reflect the improvements in detector growth and fabrication over the past several years. In addition to the spectroscopic performance of the detectors, the imaging performance of each detector was also quantified. The results show that imaging is weakly correlated to the spectroscopic performance, and more strongly correlated to the accuracy of the depth reconstruction. Other detector issues such as gain deficit and gain variation are also discussed.
Keywords :
position sensitive particle detectors; semiconductor counters; wide band gap semiconductors; 3D position-sensitive detectors; Redlen Technologies Inc; detector fabrication; detector growth; detector imaging performance; detector performance; detector spectroscopic performance; gain deficit; gain variation; pixelated CdZnTe detectors; single-pixel events; Energy resolution; Gamma ray detectors; Semiconductor radiation detectors; Wide band gap semiconductors; Gamma ray detectors; semiconductor radiation detectors; wide-band gap semiconductors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2218829
Filename :
6334457
Link To Document :
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