• DocumentCode
    1323729
  • Title

    Minimal test set for multi-output threshold circuits implemented as bubble sorting networks

  • Author

    Piestrak, S.J. ; Dandache, A.

  • Author_Institution
    Inst. of Eng. Cybern., Wroclaw Univ., Poland
  • Volume
    36
  • Issue
    3
  • fYear
    2000
  • fDate
    2/3/2000 12:00:00 AM
  • Firstpage
    202
  • Lastpage
    204
  • Abstract
    An n-input sorting network can be used to implement all n-variable symmetric threshold functions. It is shown that a systolic bubble sorting network can be tested for all single stuck-at faults by carrying out only 2 n tests
  • Keywords
    fault diagnosis; logic testing; multivalued logic circuits; sorting; threshold logic; bubble sorting networks; minimal test set; multi-output threshold circuits; n-input sorting network; n-variable symmetric threshold functions; stuck-at faults;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20000226
  • Filename
    836534
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1323729