DocumentCode :
1324149
Title :
TALk: A Temperature-Aware Leakage Minimization Technique for Real-Time Systems
Author :
Lin Yuan ; Leventhal, S.R. ; Junjun Gu ; Gang Qu
Author_Institution :
Synopsys, Inc., Mountain View, CA, USA
Volume :
30
Issue :
10
fYear :
2011
Firstpage :
1564
Lastpage :
1568
Abstract :
Due to the increasing chip temperature and the strong dependency of leakage power on temperature, thermal aware power management has received a considerable amount of attention recently in energy efficient system design. In this paper, we propose a temperature-aware intra-task scheduling algorithm to minimize leakage energy in real-time systems. The basic idea of our algorithm is to run tasks at full speed when the chip temperature is low or the work urgency is high, and switch the processor to a low-power state when the chip temperature is high or the workload is light. Our offline algorithm can achieve the optimal leakage reduction for a given task with the worst-case execution time, while the online algorithm has a very low runtime complexity. The simulation results show that the online algorithm is able to reduce 34% of total leakage energy on average in both real-world and artificial benchmarks. Finally, we demonstrate how to combine our algorithm with existing dynamic voltage scaling technique to optimize the overall energy consumption.
Keywords :
integrated circuit design; low-power electronics; microprocessor chips; real-time systems; scheduling; TALk; chip temperature; dynamic voltage scaling; energy efficient system design; leakage power; low-power state; optimal leakage reduction; realtime systems; temperature-aware intra-task scheduling; temperature-aware leakage minimization technique; thermal aware power management; Algorithm design and analysis; Benchmark testing; Heuristic algorithms; Real time systems; Switches; Temperature sensors; Voltage control; Dynamic voltage scaling; low power; real-time systems; temperature-aware design;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2011.2160541
Filename :
6022017
Link To Document :
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