DocumentCode :
1324197
Title :
Projection Process Modelling for Iterative Reconstruction of Pinhole SPECT
Author :
Lin, Jianyu ; Kench, Peter L. ; Gregoire, Marie-Claude ; Meikle, Steven R.
Author_Institution :
Ramaciotti Imaging Centre, Brain & Mind Res. Inst., Lidcombe, NSW, Australia
Volume :
57
Issue :
5
fYear :
2010
Firstpage :
2578
Lastpage :
2586
Abstract :
In iterative reconstruction of pinhole SPECT data, the forward and back projection processes are often performed using the ray tracing method. Ray tracing is computationally efficient, but it has the drawback of poor reconstruction quality due to the missing voxel effect and textural artefacts. In this paper, the pinhole projection process was modelled starting from consideration of all the main factors affecting pinhole projection, such as voxel shape, penetration of the pinhole edges and detector response. Next, approximations were made to reduce the computational speed and the effect of the approximations on reconstructed image accuracy was evaluated in simulation and phantom experiments and compared with the ray tracing algorithm. When used in conjunction with the ML-EM algorithm, the proposed model improved reconstructed image accuracy compared with the ray tracing method and achieved comparable computational efficiency. Therefore, the proposed projection model is a practical alternative to the ray tracing algorithm for pinhole SPECT reconstruction.
Keywords :
image reconstruction; iterative methods; medical image processing; phantoms; ray tracing; single photon emission computed tomography; ML-EM algorithm; iterative reconstruction; phantom experiments; pinhole SPECT; pinhole collimation; pinhole edges; projection process modelling; ray tracing method; reconstructed image accuracy; single photon emission computed tomography; voxel effect; Approximation methods; Computational modeling; Detectors; Image reconstruction; Phantoms; Ray tracing; Iterative image reconstruction algorithm; SPECT; pinhole imaging; projection;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2056932
Filename :
5571006
Link To Document :
بازگشت