Application of TMS, TMGe to high-energy X-ray tomography

Author

Mathy, F. ; Lepert, S. ; Thomas, G.

Author_Institution

CEA, Grenoble, France

Volume

26

Issue

4

fYear

1991

fDate

8/1/1991 12:00:00 AM

Firstpage

631

Lastpage

635

Abstract

The ionic mobilities of two organometallic compounds, TMS (tetramethylsilane) and TMGe (tetramethylgermanium), were measured. A TMGe detector designed for high-energy tomography was successfully tested on a 100 Hz pulsed X-ray beam produced by a 8 MeV linear accelerator; a dynamic range of five decades was measured, corresponding to 25 cm lead attenuation, with a max dose rate of 0.43 rad/s. The ratio between the electronic pulse current and the ionic interpulse current, mostly dependent on the duty cycle, was improved by means of an electronic circuit integrating during and just before the pulse

Keywords

X-ray detection and measurement; ionic conduction in solids; organic compounds; TMGe; TMGe detector; TMS; duty cycle; dynamic range; electronic circuit; electronic pulse current; high-energy X-ray tomography; ionic interpulse current; ionic mobilities; lead attenuation; max dose rate; organometallic compounds; pulsed X-ray beam; tetramethylgermanium; tetramethylsilane; Attenuation measurement; Dynamic range; Linear accelerators; Particle beams; Pulse circuits; Pulse measurements; Testing; X-ray detection; X-ray detectors; X-ray tomography;

fLanguage

English

Journal_Title

Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

0018-9367

Type

jour

DOI

10.1109/14.83682

Filename

83682