DocumentCode :
1324350
Title :
Comments on ´Compatibility-the neglected factor in insulation evaluation´ by W.B. Penn (DC machine insulation)
Author :
Cuthbert, R.L.
Author_Institution :
Dow Corning, Midland, MI, USA
Volume :
4
Issue :
3
fYear :
1988
Firstpage :
61
Abstract :
For original paper see ibid., vol.4, no.2, p.27 (1988). The commenter addresses statements by the author of the above paper concerning silicone and rapid brushwear in DC machines. This problem, which was noted several years ago, is due to improper curing of silicone products. He maintains that when proper curing is completed, silicone varnishes are the best materials to use in totally enclosed DC machines due to their lack of degradation at operating temperatures.<>
Keywords :
DC machines; machine insulation; silicones; varnish; DC machines; improper curing; machine insulation; rapid brushwear; silicone; varnishes; DC machines; Dielectrics and electrical insulation; Printed circuits; Amino Acid Sequence; Animals; Ascorbic Acid; Base Sequence; Cloning, Molecular; DNA, Complementary; Hydrogen-Ion Concentration; Kinetics; L-Gulonolactone Oxidase; Molecular Sequence Data; Molecular Weight; Oxidoreductases; Oxidoreductases Acting on CH-CH Group Donors; Plant Proteins; Rats; Saccharomyces cerevisiae; Sequence Alignment; Substrate Specificity; Sugar Alcohol Dehydrogenases;
fLanguage :
English
Journal_Title :
Electrical Insulation Magazine, IEEE
Publisher :
ieee
ISSN :
0883-7554
Type :
jour
DOI :
10.1109/57.837
Filename :
837
Link To Document :
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