Title :
Automated Near-Field Scanning Algorithm for the EMC Analysis of Electronic Devices
Author :
Deschrijver, Dirk ; Vanhee, Filip ; Pissoort, Davy ; Dhaene, Tom
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
fDate :
6/1/2012 12:00:00 AM
Abstract :
This paper presents an automated procedure to determine the electric or magnetic near-field profile of electronic systems and devices in a given plane. It combines sequential sampling to determine the optimal coordinates of near-field scan points at arbitrary coordinates in the scanning plane. The effectiveness of the approach is illustrated by applying it to both a simulated and a measured printed circuit board example.
Keywords :
electromagnetic compatibility; printed circuits; EMC analysis; automated near-field scanning algorithm; electric near-field profile; electronic devices; electronic systems; magnetic near-field profile; near-field scan points optimal coordinates; printed circuit board example; scanning plane; sequential sampling; Algorithm design and analysis; Approximation methods; Computational modeling; Data models; Electromagnetic compatibility; Noise measurement; Probes; Electromagnetic compatibility (EMC); Kriging; near-field (NF) scanning; sequential sampling; surrogate modeling;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2011.2163821
