• DocumentCode
    1325457
  • Title

    Operation range of VCSEL-interconnect links with "below-threshold"-biasing

  • Author

    Zei, L. ; Petermann, K. ; Jager, Rudolf ; Ebeling, K.J.

  • Author_Institution
    Inst. fur Nachrichtentech. und Theor. Elektrotech., Tech. Univ. Berlin, Germany
  • Volume
    18
  • Issue
    4
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    477
  • Lastpage
    481
  • Abstract
    Biasing lasers below threshold in interconnect links yields a lower effort for the monitoring circuitry, but it leads to a significant turn-on jitter due to the bit-pattern effects and spontaneous emission. An analytical expression describing the probability density function (pdf) of the total turn-on delay for a single-mode vertical-cavity surface-emitting laser (VCSEL) biased below threshold is derived, which accounts for both bit-pattern effects and spontaneous emission. In a high speed digital transmission system both timing jitter as well as the signal-to-noise ratio (SNR) limit the system-performance, which can be measured by the resulting bit-error rate (BER). The measured BER is compared with the calculated BER yielding good agreement. Therefore, following the quite general guideline as presented here, the operation range for "below-threshold"-biased VCSEL-interconnect links can be determined.
  • Keywords
    jitter; optical interconnections; semiconductor lasers; spontaneous emission; surface emitting lasers; VCSEL; VCSEL-interconnect links; below-threshold biasing; below-threshold-biased VCSEL-interconnect links; biasing lasers; bit-error rate; bit-pattern effects; interconnect links; monitoring circuitry; operation range; probability density function; single-mode vertical-cavity surface-emitting laser; spontaneous emission; total turn-on delay; turn-on jitter; Bit error rate; Delay effects; Integrated circuit interconnections; Monitoring; Probability density function; Signal to noise ratio; Spontaneous emission; Surface emitting lasers; Timing jitter; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.838121
  • Filename
    838121