DocumentCode :
1325457
Title :
Operation range of VCSEL-interconnect links with "below-threshold"-biasing
Author :
Zei, L. ; Petermann, K. ; Jager, Rudolf ; Ebeling, K.J.
Author_Institution :
Inst. fur Nachrichtentech. und Theor. Elektrotech., Tech. Univ. Berlin, Germany
Volume :
18
Issue :
4
fYear :
2000
fDate :
4/1/2000 12:00:00 AM
Firstpage :
477
Lastpage :
481
Abstract :
Biasing lasers below threshold in interconnect links yields a lower effort for the monitoring circuitry, but it leads to a significant turn-on jitter due to the bit-pattern effects and spontaneous emission. An analytical expression describing the probability density function (pdf) of the total turn-on delay for a single-mode vertical-cavity surface-emitting laser (VCSEL) biased below threshold is derived, which accounts for both bit-pattern effects and spontaneous emission. In a high speed digital transmission system both timing jitter as well as the signal-to-noise ratio (SNR) limit the system-performance, which can be measured by the resulting bit-error rate (BER). The measured BER is compared with the calculated BER yielding good agreement. Therefore, following the quite general guideline as presented here, the operation range for "below-threshold"-biased VCSEL-interconnect links can be determined.
Keywords :
jitter; optical interconnections; semiconductor lasers; spontaneous emission; surface emitting lasers; VCSEL; VCSEL-interconnect links; below-threshold biasing; below-threshold-biased VCSEL-interconnect links; biasing lasers; bit-error rate; bit-pattern effects; interconnect links; monitoring circuitry; operation range; probability density function; single-mode vertical-cavity surface-emitting laser; spontaneous emission; total turn-on delay; turn-on jitter; Bit error rate; Delay effects; Integrated circuit interconnections; Monitoring; Probability density function; Signal to noise ratio; Spontaneous emission; Surface emitting lasers; Timing jitter; Vertical cavity surface emitting lasers;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.838121
Filename :
838121
Link To Document :
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