Title :
On the expandability of free-space micromachined optical cross connects
Author :
Lin, Lih-Yuan ; Goldstein, Evan L. ; Tkach, Robert W.
Author_Institution :
AT&T Labs.-Res., Red Bank, NJ, USA
fDate :
4/1/2000 12:00:00 AM
Abstract :
Free-space micromachined optical-switching technology has emerged as a promising candidate for the large-scale optical cross connects that are needed in next-generation optical-transport networks. Although this technology has demonstrated good optical performance, its ability to expand to the required port-count while remaining within reasonable optical loss budgets has yet to be demonstrated. In this paper, we theoretically analyze the expandability of free-space micromachined optical switches. The chief loss mechanisms-Gaussian-beam divergence and angular misalignment-are analyzed both theoretically and experimentally. We find that micromirror angular repeatability in such a cross connect must be accurate within about 0.1/spl deg/, and show that integrated mechanical structures are capable of achieving this goal. These results in general suggest that free-space micromachined optical-switching technology appears capable of achieving the port-count required by core-transport networks while remaining within cross-office optical-loss budgets.
Keywords :
electro-optical switches; micro-optics; micromachining; micromechanical devices; mirrors; optical interconnections; optical losses; wavelength division multiplexing; Gaussian-beam divergence; angular misalignment; cross-office optical-loss budgets; free-space micromachined optical cross connects; free-space micromachined optical-switching technology; integrated mechanical structures; large-scale optical cross connects; micromirror angular repeatability; next-generation optical-transport networks; optical loss budgets; port-count; Fabrics; Integrated optics; Micromechanical devices; Micromirrors; Optical beams; Optical crosstalk; Optical fiber networks; Optical interconnections; Optical losses; Optical switches;
Journal_Title :
Lightwave Technology, Journal of