DocumentCode
1325739
Title
Static analysis of microstrip discontinuities using the excess charge density in the spectral domain
Author
Martel, Jesus ; Boix, Rafael R. ; Horno, Manuel
Author_Institution
Dept. of Electron. & Electromagn., Seville Univ., Spain
Volume
39
Issue
9
fYear
1991
fDate
9/1/1991 12:00:00 AM
Firstpage
1623
Lastpage
1631
Abstract
Galerkin´s method in the spectral domain is applied to solve for the excess charge density existing on the strips of open-end and symmetric gap discontinuities in multilayered anisotropic substrates. The excess charge density is used to determine the capacitance components of the equivalent circuits, of these discontinuities. Numerical results are provided and a comparison with previous results is carried out
Keywords
equivalent circuits; strip lines; waveguide theory; Galerkin´s method; capacitance components; equivalent circuits; excess charge density; microstrip discontinuities; multilayered anisotropic substrates; spectral domain; Anisotropic magnetoresistance; Capacitance; Coupling circuits; Dielectric materials; Equivalent circuits; Frequency; Microstrip; Optical losses; Scattering parameters; Strips;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.83839
Filename
83839
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