DocumentCode :
1326204
Title :
Eliminating the Low-Frequency Breakdown Problem in 3-D Full-Wave Finite-Element-Based Analysis of Integrated Circuits
Author :
Zhu, Jianfang ; Jiao, Dan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
58
Issue :
10
fYear :
2010
Firstpage :
2633
Lastpage :
2645
Abstract :
An effective method is developed in this work to extend the validity of a full-wave finite-element-based solution down to dc for general 3-D problems. In this method, we accurately decompose the Maxwell´s system at low frequencies into two subsystems in the framework of a full-wave-based solution. One has an analytical frequency dependence, whereas the other can be solved at frequencies as low as dc. Thus, we bypass the numerical difficulty of solving a highly ill-conditioned and even singular system at low frequencies. In addition, we provide a theoretical analysis on the conditioning of the matrices of the original coupled Maxwell´s system and the decomposed system. We show that the decomposed system is well conditioned, and also positive definite at dc. The validity and accuracy of the proposed method have been demonstrated by extraction of state-of-the-art on-chip integrated circuits at frequencies as low as dc.
Keywords :
Maxwell equations; finite element analysis; integrated circuit testing; 3D full-wave finite-element-based analysis; Maxwell´s system; decomposed system; full-wave finite-element-based solution; low-frequency breakdown problem elimination; state-of-the-art on-chip integrated circuits; Conductors; Eigenvalues and eigenfunctions; Electric breakdown; Frequency dependence; Integrated circuit modeling; Propagation; System-on-a-chip; Electromagnetic analysis; finite-element methods (FEMs); full-wave analysis; integrated circuits (ICs); low-frequency breakdown;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2010.2065930
Filename :
5575379
Link To Document :
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