• DocumentCode
    1326267
  • Title

    An Approach to Single Event Testing of SDRAMs

  • Author

    Adell, Philippe C. ; Edmonds, Larry ; McPeak, Richard ; Scheick, Leif ; McClure, Steve S.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    57
  • Issue
    5
  • fYear
    2010
  • Firstpage
    2923
  • Lastpage
    2928
  • Abstract
    A unique testing approach based on error-pattern identification with a graphical mapping and color-coding of the full SDRAM memory during single-event characterization is proposed. Results about unique SEFI modes and the role of temperature are discussed.
  • Keywords
    DRAM chips; integrated circuit testing; SEFI modes; color-coding; error-pattern identification; full SDRAM memory; graphical mapping; single event testing; single-event characterization; Radiation effects; Registers; SDRAM; Temperature dependence; Temperature distribution; Temperature measurement; Testing; Micro-displacement; SDRAMs; single event effects; stuck bits;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2059711
  • Filename
    5575387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1326267