DocumentCode
1326268
Title
A Sub-Nyquist Rate Compressive Sensing Data Acquisition Front-End
Author
Chen, Xi ; Sobhy, Ehab Ahmed ; Yu, Zhuizhuan ; Hoyos, Sebastian ; Silva-Martinez, Jose ; Palermo, Samuel ; Sadler, Brian M.
Author_Institution
Broadcom, Irvine, CA, USA
Volume
2
Issue
3
fYear
2012
Firstpage
542
Lastpage
551
Abstract
This paper presents a sub-Nyquist rate data acquisition front-end based on compressive sensing theory. The front-end randomizes a sparse input signal by mixing it with pseudo-random number sequences, followed by analog-to-digital converter sampling at sub-Nyquist rate. The signal is then reconstructed using an L1-based optimization algorithm that exploits the signal sparsity to reconstruct the signal with high fidelity. The reconstruction is based on a priori signal model information, such as a multi-tone frequency-sparse model which matches the input signal frequency support. Wideband multi-tone test signals with 4% sparsity in 5~500 MHz band were used to experimentally verify the front-end performance. Single-tone and multi-tone tests show maximum signal to noise and distortion ratios of 40 dB and 30 dB, respectively, with an equivalent sampling rate of 1 GS/s. The analog front-end was fabricated in a 90 nm complementary metal-oxide-semiconductor process and consumes 55 mW. The front-end core occupies 0.93 mm2.
Keywords
CMOS integrated circuits; analogue-digital conversion; compressed sensing; distortion; optimisation; random number generation; random sequences; signal detection; signal reconstruction; signal sampling; L1-based optimization algorithm; a priori signal model; analog-to-digital converter; complementary metal oxide semiconductor process; data acquisition frontend; equivalent sampling rate; frequency 5 MHz to 500 MHz; pseudorandom number sequence; signal distortion; signal reconstruction; signal sampling; signal sparsity; size 90 nm; sparse input signal; sub-Nyquist rate compressive sensing; wideband multitone test signal; Analog-digital conversion; Compressed sensing; Converters; Distortion measurement; Generators; Wideband; Analog-to-digital converters (ADCs); compressive sensing (CS); low-power circuit; sub-Nyquist ADC; wideband front-end;
fLanguage
English
Journal_Title
Emerging and Selected Topics in Circuits and Systems, IEEE Journal on
Publisher
ieee
ISSN
2156-3357
Type
jour
DOI
10.1109/JETCAS.2012.2221531
Filename
6338302
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