DocumentCode
1326592
Title
Enhanced frequency agility of high-power relativistic backward wave oscillators
Author
Moreland, Larald D. ; Schamiloglu, Edl ; Lemke, Raymond W. ; Roitman, A.M. ; Korovin, S.D. ; Rostov, V.V.
Author_Institution
Dept. of Electr. & Comput. Eng., New Mexico Univ., Albuquerque, NM, USA
Volume
24
Issue
3
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
852
Lastpage
858
Abstract
This paper describes how finite length effects in high-power backward wave oscillators can be exploited in a controlled manner to achieve enhanced frequency agility. Experiments were performed using a Sinus-6 high-power relativistic repetitively pulsed electron beam accelerator. A uniform slow wave structure was used in these studies and its parameters were fixed. Sections of smooth-walled circular waveguide of varying lengths were inserted both before and after the slow wave structure. Variations in the length of smooth-walled waveguide on the order of a quarter-wavelength of the generated electromagnetic radiation were found to significantly affect both microwave frequency and radiation efficiency in a periodic-like manner. The experimental results were reproduced in TWOQUICK electromagnetic particle-in-cell simulations. A bandwidth of about 500 MHz centered around 9.5 GHz at hundreds of MW power levels has been achieved with constant beam and slow wave structure parameters
Keywords
backward wave oscillators; circular waveguides; relativistic electron beam tubes; slow wave structures; 9.5 GHz; Sinus-6 high-power relativistic repetitively pulsed electron beam accelerator; TWOQUICK electromagnetic particle-in-cell simulations; electromagnetic radiation; enhanced frequency agility; finite length effects; high-power relativistic backward wave oscillators; microwave frequency; radiation efficiency; slow wave structure; smooth-walled circular waveguide; Bandwidth; Dispersion; Electron beams; Frequency; Laboratories; Microwave devices; Millimeter wave propagation; Neck; Optical reflection; Oscillators;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.533088
Filename
533088
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