Title :
Robust nonlinear H∞ synchronization of chaotic Lur´e systems
Author :
Suykens, Johan A K ; Curran, Paul F. ; Vandewalle, Joos ; Chua, Leon O.
Author_Institution :
ESAT, Katholieke Univ., Leuven, Heverlee, Belgium
fDate :
10/1/1997 12:00:00 AM
Abstract :
We propose a method of robust nonlinear H∞ master-slave synchronization for chaotic Lur´e systems with applications to secure communication. The scheme makes use of vector field modulation and either full static state or linear dynamic output error feedback control. The master-slave systems are assumed to be nonidentical and channel noise is taken into account. Binary valued continuous time message signals are recovered by minimizing the L2-gain from the exogenous input to the tracking error for the standard plant representation of the scheme. The exogenous input takes into account the message signal, channel noise and parameter mismatch. Matrix inequality conditions for dissipativity with finite L2-gain of the standard plant form are derived based on a quadratic storage function. The controllers are designed by solving a nonlinear optimization problem which takes into account both channel noise and parameter mismatch. The method is illustrated on Chua´s circuit
Keywords :
Chua´s circuit; H∞ optimisation; chaos; continuous time systems; data communication; nonlinear systems; robust control; security of data; synchronisation; Chua´s circuit; binary valued continuous time message signals; channel noise; chaotic Lur´e systems; dissipativity; error feedback control; exogenous input; full static state; linear dynamic output; matrix inequality conditions; nonidentical master-slave systems; nonlinear optimization problem; parameter mismatch; quadratic storage function; robust nonlinear H∞ master-slave synchronization; secure communication; standard plant representation; vector field modulation; Chaos; Chaotic communication; Circuits; Communication system control; Control theory; Design optimization; H infinity control; Linear matrix inequalities; Nonlinear systems; Robustness;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on