DocumentCode :
1326845
Title :
Linearized field theory of a dielectric-loaded helix traveling wave tube amplifier
Author :
Freund, H.P. ; Zaidman, Ernest G. ; Kodis, Mary Anne ; Vanderplaats, N.R.
Author_Institution :
Sci. Applications Int. Corp., McLean, VA, USA
Volume :
24
Issue :
3
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
895
Lastpage :
904
Abstract :
A linearized relativistic field theory of a helix traveling wave tube (TWT) is presented for a configuration where either a thin annular beam or a solid beam propagates through a sheath helix enclosed within a loss-free wall in which the gap between the helix and the outer wall is filled with a dielectric. A linear analysis of the interaction is solved subject to the boundary conditions imposed by the beam, helix, and wall. In the case of the annular beam, the electrons are assumed to be strongly magnetized. In contrast, the effect of variations in the axial magnetic field are included in the electron dynamics for the solid beam analysis. Determinantal dispersion equations are obtained for the azimuthally symmetric modes which implicitly includes beam space-charge effects without recourse to a heuristic model of the space-charge field. Numerical solutions of the dispersion equations are discussed and compared with experiments
Keywords :
microwave power amplifiers; travelling wave amplifiers; travelling wave tubes; axial magnetic field; azimuthally symmetric modes; beam space-charge effects; boundary conditions; determinantal dispersion equations; dielectric-loaded helix traveling wave tube amplifier; dispersion equations; electron dynamics; helix traveling wave tube; heuristic model; linearized relativistic field theory; numerical solutions; sheath helix; solid beam; solid beam analysis; space-charge field; thin annular beam; Boundary conditions; Dielectric losses; Dispersion; Electron beams; Helium; Laboratories; Magnetic analysis; Maxwell equations; Propagation losses; Solids;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.533093
Filename :
533093
Link To Document :
بازگشت