• DocumentCode
    1327133
  • Title

    Statistical design techniques for high-speed circuit boards with correlated structure distributions

  • Author

    Mikazuki, Tetsuo ; Matsui, Norio

  • Author_Institution
    NTT Commun. Switching Lab., Tokyo, Japan
  • Volume
    14
  • Issue
    3
  • fYear
    1991
  • fDate
    9/1/1991 12:00:00 AM
  • Firstpage
    512
  • Lastpage
    517
  • Abstract
    Statistical design techniques for the line structures of high-speed circuit boards have been developed. These techniques account for dimensional distribution correlations caused by the fabrication process. Monte Carlo simulation is introduced into the finite element method for calculating line parameters. The eye pattern at the receiving end of transmission lines with parallel and stub parts is simulated, using distributed circuit modes, for the calculated line parameter distributions. The simulator has an algorithm to save computer time. The calculated and experimental results are compared, and the accuracy of the simulation is discussed. Calculation results imply that the evaluation for the dimensional distribution of fabrication processes is very important. The timing and amplitude margins were found to strongly depend on fabrication deviations
  • Keywords
    Monte Carlo methods; circuit layout CAD; printed circuit design; Monte Carlo simulation; amplitude margins; correlated structure distributions; dimensional distribution correlations; dimensional distribution of fabrication processes; distributed circuit modes; fabrication deviations; finite element method; high-speed circuit boards; impedance controlled wiring; line parameter distributions; line structures; statistical design techniques; timing margins; Circuit noise; Circuit simulation; Communication switching; Computational modeling; Computer simulation; Crosstalk; Distributed parameter circuits; Fabrication; Finite element methods; Printed circuits;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.83936
  • Filename
    83936