Title :
A 1-µW 10-bit 200-kS/s SAR ADC With a Bypass Window for Biomedical Applications
Author :
Huang, Guan-Ying ; Chang, Soon-Jyh ; Liu, Chun-Cheng ; Lin, Ying-Zu
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
Abstract :
This paper presents an energy efficient successive-approximation-register (SAR) analog-to-digital converter (ADC) for biomedical applications. To reduce energy consumption, a bypass window technique is used to select switching sequences to skip several conversion steps when the signal is within a predefined small window. The power consumptions of the capacitive digital-to-analog converter (DAC), latch comparator, and digital control circuit of the proposed ADC are lower than those of a conventional SAR ADC. The proposed bypass window tolerates the DAC settling error and comparator voltage offset in the first four phases and suppresses the peak DNL and INL values. A proof-of-concept prototype was fabricated in 0.18-μm 1P6M CMOS technology. At a 0.6-V supply voltage and a 200-kS/s sampling rate, the ADC achieves a signal-to-noise and distortion ratio of 57.97 dB and consumes 1.04 μW, resulting in a figure of merit of 8.03 fJ/conversion-step. The ADC core occupies an active area of only 0.082 mm2.
Keywords :
CMOS integrated circuits; analogue-digital conversion; biomedical electronics; comparators (circuits); digital-analogue conversion; 1P6M CMOS technology; DAC; DAC settling error; SAR ADC; biomedical applications; bypass window technique; capacitive digital-to-analog converter; comparator voltage offset; digital control circuit; energy consumption; figure of merit; latch comparator; power 1 muW; power 1.04 muW; power consumptions; signal-to-noise-distortion ratio; size 0.18 mum; successive-approximation-register analog-to-digital converter; switching sequences; voltage 0.6 V; word length 10 bit; Arrays; Capacitors; Digital control; Power demand; Switches; Windows; Bypass window SAR ADC; SAR ADC; incomplete settling tolerance; low power ADC; successive approximation analog-to-digital converter;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2012.2217635