Coupling of edge-element and mode-matching for multistep dielectric discontinuity in guiding structures

Author

Xu, Shanjia ; Sheng, Xinquing

Author_Institution

Dept. of Electron. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Hefei, China

Volume

45

Issue

2

fYear

1997

fDate

2/1/1997 12:00:00 AM

Firstpage

284

Lastpage

287

Abstract

A new approach is proposed for dielectric multistep discontinuity in guiding structures which combines edge-element analysis with the mode-matching method and multimode network theory. It is demonstrated that the approach has the generality of the edge-element analysis and the simplicity of the multimode network method, while retaining the high accuracy of the mode-matching method. The calculations for different multistep discontinuities verify the effectiveness and suitability of the approach for analysis of three-dimensional (3-D) lossy dielectric discontinuity problem

Keywords

dielectric-loaded waveguides; eigenvalues and eigenfunctions; mode matching; waveguide discontinuities; waveguide theory; 3D lossy dielectric discontinuity problem; edge-element analysis; guiding structures; mode-matching method; multimode network theory; multistep dielectric discontinuity; three-dimensional discontinuity problem; Circuits; Convergence; Dielectric losses; Eigenvalues and eigenfunctions; Finite element methods; Intelligent networks; Mode matching methods; Scattering; Semiconductor waveguides; Waveguide components;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.557612

Filename

557612