• DocumentCode
    1327796
  • Title

    Widely programmable high-frequency continuous-time filters in digital CMOS technology

  • Author

    Pavan, Shanthi ; Tsividis, Yannis P. ; Nagaraj, Krishnaswamy

  • Author_Institution
    Texas Instrum. Inc., Warren, NJ, USA
  • Volume
    35
  • Issue
    4
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    503
  • Lastpage
    511
  • Abstract
    We present design considerations for programmable high-frequency continuous-time filters implemented in standard digital CMOS processes. To reduce area, accumulation MOS capacitors are used as integrating elements. The filter design problem is examined from the viewpoint of programmability. To allow frequency scalability without deterioration of noise performance and of the frequency response shape, we employ a technique called "constant-capacitance scaling," which assures that even parasitic capacitances remain invariant when transconductors are switched in and out of the filter. This technique is applied to the design of a programmable fourth order Butterworth continuous-time filter with a bandwidth programmable from 60 to 350 MHz implemented in a 0.25-/spl mu/m digital CMOS process. The filter has a dynamic range of 54 dB, dissipates 70 mW from a 3.3-V supply, and occupies an area of 0.15 mm/sup 2/.
  • Keywords
    Butterworth filters; CMOS integrated circuits; continuous time filters; frequency response; programmable filters; 0.25 micron; 3.3 V; 60 to 350 MHz; 70 mW; Butterworth continuous-time filter; accumulation MOS capacitors; constant-capacitance scaling; digital CMOS technology; dynamic range; filter design problem; frequency response shape; frequency scalability; parasitic capacitances; programmable high-frequency continuous-time filters; Bandwidth; CMOS process; Digital filters; Frequency response; MOS capacitors; Noise shaping; Parasitic capacitance; Scalability; Shape; Transconductors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.839910
  • Filename
    839910