Title :
Dependence of the Property of InGaN p-i-n Solar Cells on the Light Concentration and Temperature
Author :
Cai, Xiao-Mei ; Zeng, Sheng-Wei ; Li, Xin ; Zhang, Jiang-Yong ; Lin, Shuo ; An-Kai Lin ; Chen, Ming ; Liu, Wen-Jie ; Wu, Shao-Xiong ; Zhang, Bao-Ping
Author_Institution :
Dept. of Phys., Xiamen Univ., Xiamen, China
Abstract :
The effects of the light concentration and temperature on the performance of InGaN p-i-n homojunction solar cells were investigated experimentally. With the increase in the light concentration, the short-circuit current density Jsc increases linearly, and the open-circuit voltage Voc increases logarithmically. However, the fill factor FF and the relative efficiency η increase first and then decrease. On the other hand, the performance of the solar cell becomes worse with the increase in temperature. The temperature coefficients of important parameters related with the cell property were discussed. The red shift of the peak external quantum efficiencies was observed with increasing temperature due to the band-gap shrinkage. In addition, the ideality factor n and the reverse saturation current density Js were also investigated to reveal the intrinsic mechanism of temperature dependence and the effect of crystalline quality. This paper provides the variation trends of device characteristics, which are useful references concerning the reliability of GaN-based solar cells.
Keywords :
III-V semiconductors; gallium compounds; indium compounds; reliability; short-circuit currents; solar cells; wide band gap semiconductors; InGaN; band-gap shrinkage; cell property; crystalline quality; light concentration; open-circuit voltage; p-i-n homojunction solar cell; peak external quantum efficiency; reverse saturation current density; short-circuit current density; temperature coefficient; Absorption; PIN photodiodes; Photonic band gap; Photovoltaic cells; Temperature; Temperature dependence; Temperature measurement; Illumination dependence; InGaN; reliability; solar cell; temperature dependence;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2166118