DocumentCode :
1327965
Title :
Silicon carbide JFET reverse conduction characteristics and use in power converters
Author :
Shillington, R. ; Gaynor, Paul ; Harrison, Michael ; Heffernan, W.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Canterbury, Christchurch, New Zealand
Volume :
5
Issue :
8
fYear :
2012
fDate :
9/1/2012 12:00:00 AM
Firstpage :
1282
Lastpage :
1290
Abstract :
Recent advances have resulted in the availability of a new generation of silicon carbide (SiC) junction field effect transistors (JFETs), which unlike previous generations, exhibit highly desirable normally off characteristics. Normally off SiC JFETs are characterised with particular focus on previously unknown reverse conduction characteristics. Refinements are proposed to JFET gate driving circuits that allow their implementation as a single-chip solution. Reverse recovery characteristics of SiC JFETs were measured using diode testing techniques and found to be significantly faster than typical silicon metal oxide semi-conductor field effect transistor (MOSFET) body diodes. SiC JFETs are compared with silicon MOSFETs in power factor correction boost converters, including a real-world application where superior power conversion efficiency utilising SiC JFETs is demonstrated.
Keywords :
MOSFET; junction gate field effect transistors; power convertors; power factor correction; MOSFET; SiC; diode testing techniques; junction field effect transistors; power factor correction boost converters; reverse recovery characteristics; silicon carbide JFET reverse conduction characteristics; silicon metal oxide semi-conductor field effect transistor; single-chip solution;
fLanguage :
English
Journal_Title :
Power Electronics, IET
Publisher :
iet
ISSN :
1755-4535
Type :
jour
DOI :
10.1049/iet-pel.2011.0404
Filename :
6340661
Link To Document :
بازگشت