DocumentCode :
132811
Title :
Using FPGA as synthetic instrumentation in automated test sets: Benefits and examples
Author :
Dziuk, Madaline A.
Author_Institution :
Automated Test Syst. Group, CACI, Inc. - Fed., San Antonio, TX, USA
fYear :
2014
fDate :
15-18 Sept. 2014
Firstpage :
136
Lastpage :
141
Abstract :
The use of Field Programmable Gate Array (FPGA) hardware in Test Program Set (TPS) development is highly beneficial due to its ability to be reconfigured on the fly to simulate various ATE instruments or unique signals generated from discrete hardware components. FPGA hardware can by utilized for creating an array of synthetic instruments; and by utilizing a FPGA, a single piece of hardware can be used for multiple TPS applications, saving both time and money. Not only can FPGA hardware be used as a digital filter (which can replace physical discrete RC-circuits and other filtering circuits) but it can also aid in the simulation of obsolete parts or instruments commonly found when re-hosting TPSs from legacy test sets. Hardware obsolescence is a common problem in maintaining ATS systems for the life cycle of its intended use. When re-hosting or developing new ATS equipment, it is important for designers to plan for the longevity of their hardware. FPGAs solve this problem by simulating output signals from these obsolete instruments/parts and by doing so, end users can more easily maintain their TPS equipment when it has been put out into the field. This paper highlights a few successfully developed FPGA implementations used as synthetic instrumentation in an ATS environment. These implementations were designed for various CACI Common Bench-Top Automatic Test Set (CBATS) 201 TPS systems. The CACI CBATS 201 is a bench top tester built around a National Instrument´s PXI chassis and utilizes a PXI-7852R Multifunction RIO with Virtex-5 LX50 FPGA. The FPGA applications pertaining to ATS environments described thought-out this document include: simulating an aircraft Lift Vane Transducer (LVT) output signals, simulating synchro leg voltages, and simulating custom digital communication protocol chip hardware. The applications mentioned here are currently integrated in delivered TPS, and are being used to aid in the depot testing of various military aircraft Line Replaceme- t Units (LRU).
Keywords :
automatic test equipment; circuit simulation; digital communication; digital filters; field buses; field programmable gate arrays; military aircraft; protocols; signal generators; software maintenance; transducers; ATS system maintenance; CACI CBATS 201; LRU; LVT; PXI-7852R multifunction RIO; TPS applications; Virtex-5 LX50 FPGA; aircraft lift vane transducer; bench top tester; common bench top automatic test set; custom digital communication protocol chip hardware; digital filter; discrete hardware components; field programmable gate array; hardware obsolescence; legacy test sets; life cycle; military aircraft line replacement units; national instrument PXI; obsolete instrument; signal generation; synchro leg voltage; synthetic instrumentation; test program set; Blades; Field programmable gate arrays; Hardware; Instruments; Mathematical model; Protocols; Synchronization; Automatic Test Equipment; Automatic Testing; Circuit Simulation; Field Programmable Gate Arrays; Maintenance; Numerical Simulation; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
Type :
conf
DOI :
10.1109/AUTEST.2014.6935134
Filename :
6935134
Link To Document :
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