DocumentCode :
132838
Title :
Automated TPS conversion
Author :
Headrick, William J. ; Garcia, Gaetan ; Lopes, Teresa ; Rutledge, Michael J.
Author_Institution :
Lockheed Martin Mission Syst. & Training, Orlando, FL, USA
fYear :
2014
fDate :
15-18 Sept. 2014
Firstpage :
205
Lastpage :
208
Abstract :
The conversion of an existing Test Program Set (TPS) from an existing platform to a newer platform is an expensive endeavor. The costs include conversion of the TPS source code to make it compatible with the new system, converting any external Digital Tests and the conversion of any number of associated support files. In addition, once this is done the TPS must be validated on the new platform (and often modified because of parametric differences in platforms). Each step of this process must typically be done by hand at great expense. This paper will show how a set of tools were combined to create an almost completely automated process which converts the TPS(s) while reducing the incidence of manual intervention to a very manageable amount. In this case the Automatic Test Equipment (ATE) was designed from the start to be compatible with the legacy system it was replacing. This helps reduce costs associated with the final integration phase, but still would require the conversion of the large number of TPSs by hand. Since the legacy compiler and Test Exec could not be reused due to cost and compatibility concerns a methodology needed to be developed to convert the large number of TPSs automatically to reduce the costs associated with the process. This methodology needed to be able to handle all of the tasks required for the conversion of TPSs as much as possible since single simple tasks such as converting graphics files multiplied by the number per TPS and then by the number of TPSs quickly escalates into an extremely time consuming and expensive process. It will be shown how this process can quickly reduce the cost of conversion to something manageable by a small team of developers to ensure a quality product. In addition, it will be shown how this process can be extended to show how multiple platforms (of ATE) can be supported from a single set of source code, further reducing development and sustainment costs.
Keywords :
automatic test equipment; cost reduction; digital instrumentation; product quality; software maintenance; software quality; source code (software); ATE; TPS source code; automated TPS conversion; automatic test equipment; development cost reduction; digital test; graphics files conversion; legacy system; quality product; sustainment cost reduction; test program set; Aging; Graphical user interfaces; Graphics; MIMICs; Manuals; Software; XML;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
Type :
conf
DOI :
10.1109/AUTEST.2014.6935146
Filename :
6935146
Link To Document :
بازگشت