Title :
A Statistical Study of De-Embedding Applied to Eye Diagram Analysis
Author :
Hale, Paul D. ; Jargon, Jeffrey ; Wang, C. M Jack ; Grossman, Brett ; Claudius, Mathew ; Torres, José L. ; Dienstfrey, Andrew ; Williams, Dylan F.
Author_Institution :
Optoelectron. Div., Nat. Inst. of Stand. & Technol. (NIST), Boulder, CO, USA
Abstract :
We describe a stable method for calibrating digital waveforms and eye diagrams by use of the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any associated cables and test fixtures. We demonstrate the effectiveness of the method by performing a statistical analysis of the calculated eye height and eye width obtained from a controlled experiment consisting of multiple cable lengths, bit rates, and oscilloscope samplers. We also demonstrate our approach by measuring the transmission through a test device consisting of a short length of cable, a ball-grid array socket, and complicated circuit board.
Keywords :
ball grid arrays; oscilloscopes; statistical analysis; waveform analysis; ball-grid array socket; bit rate; cable length; circuit board; deembedding; digital waveform; eye diagram analysis; eye height; eye width; measurement system response function; oscilloscope; statistical analysis; statistical study; test fixture; transmission measurement; Calibration; Deconvolution; Distortion measurement; Generators; Loss measurement; NIST; Oscilloscopes; Deconvolution; de-embedding; eye diagram; eye pattern; inverse problems; regularization;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2011.2164853