Title :
Dynamic characterisation of high-speed latching comparators
Author :
Boni, A. ; Chiorboli, G. ; Morandi, C.
Author_Institution :
Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy
fDate :
3/2/2000 12:00:00 AM
Abstract :
The internal noise of latching comparators is a critical parameter in high-speed A/D converter. A new noise measurement technique utilising a noise voltage-to-output frequency conversion approach is presented. The advantages of this technique are increased accuracy, bandwidth and ease of use
Keywords :
analogue-digital conversion; comparators (circuits); electric noise measurement; high-speed integrated circuits; integrated circuit noise; integrated circuit testing; A/D converter; dynamic characterisation; high-speed ADC; high-speed latching comparators; internal noise; noise measurement technique; noise voltage-to-output frequency conversion;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20000369
