• DocumentCode
    1328667
  • Title

    Reply to Comments on "A Causal Redefinition of Failure RateߞTheorems, Stress Dependence, and Application to Devices and Distributions"

  • Author

    Stewart, Robert G.

  • Author_Institution
    Lockheed Palo Alto Research Lab., Palo Alto, Calif.
  • Issue
    3
  • fYear
    1967
  • Firstpage
    134
  • Lastpage
    135
  • Keywords
    Assembly systems; Degradation; Electrons; Hazards; Reliability theory; Shape; Stress; Testing; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1967.5217483
  • Filename
    5217483
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1328667