• DocumentCode
    1328784
  • Title

    Reliability Physics Models

  • Author

    Shooman, Martin L.

  • Author_Institution
    Department of Electrical Engineering, Polytechnic Institute of Brooklyn, Brooklyn, N. Y.
  • Issue
    1
  • fYear
    1968
  • fDate
    3/1/1968 12:00:00 AM
  • Firstpage
    14
  • Lastpage
    20
  • Abstract
    The generalized stress-strength model which is prevalent in current literature is perhaps the closest that analysts have come to a general physical model. To obtain a failure density function and associated hazard function one must assume a certain probability distribution for the part strength and a particular amplitude distribution and frequency of occurrence distribution for the part stress. If one assumes a normal strength distribution and Poisson distributed stress occurrence times with normally distributed amplitudes, then this leads to an exponential failure density function and a constant hazard. Such a model is probably best suited for situations in which the part generally lasts a long time and only seems to fail when on occasion a large stress occurs. In many situations the failure of parts seems to fit a different pattern. The part is operated at nearly a constant stress level; however, the part strength gradually deteriorates with time. As time goes on the rate of deterioration should increase sharply as wear-out is reached and cause an increase in hazard. A probabilistic model which fits this hypothesis is a constantly applied stress and a Rayleigh distributed part strength. The parameter of the Rayleigh distribution is allowed to increase in an exponential fashion with time which produces the strength deterioration effect. Basically the failure rate turns out to depend on the square of the applied stress; however, if the strength deterioration rate is allowed to be a function of the input stress, other behaviors are predicted.
  • Keywords
    Capacitors; Costs; Hazards; Humidity; Life testing; Physics; Stress; Temperature dependence; Temperature distribution; Voltage;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1968.5217501
  • Filename
    5217501