DocumentCode :
1328784
Title :
Reliability Physics Models
Author :
Shooman, Martin L.
Author_Institution :
Department of Electrical Engineering, Polytechnic Institute of Brooklyn, Brooklyn, N. Y.
Issue :
1
fYear :
1968
fDate :
3/1/1968 12:00:00 AM
Firstpage :
14
Lastpage :
20
Abstract :
The generalized stress-strength model which is prevalent in current literature is perhaps the closest that analysts have come to a general physical model. To obtain a failure density function and associated hazard function one must assume a certain probability distribution for the part strength and a particular amplitude distribution and frequency of occurrence distribution for the part stress. If one assumes a normal strength distribution and Poisson distributed stress occurrence times with normally distributed amplitudes, then this leads to an exponential failure density function and a constant hazard. Such a model is probably best suited for situations in which the part generally lasts a long time and only seems to fail when on occasion a large stress occurs. In many situations the failure of parts seems to fit a different pattern. The part is operated at nearly a constant stress level; however, the part strength gradually deteriorates with time. As time goes on the rate of deterioration should increase sharply as wear-out is reached and cause an increase in hazard. A probabilistic model which fits this hypothesis is a constantly applied stress and a Rayleigh distributed part strength. The parameter of the Rayleigh distribution is allowed to increase in an exponential fashion with time which produces the strength deterioration effect. Basically the failure rate turns out to depend on the square of the applied stress; however, if the strength deterioration rate is allowed to be a function of the input stress, other behaviors are predicted.
Keywords :
Capacitors; Costs; Hazards; Humidity; Life testing; Physics; Stress; Temperature dependence; Temperature distribution; Voltage;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1968.5217501
Filename :
5217501
Link To Document :
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