Title :
Next-generation synthetic instruments
Author_Institution :
Automated Test Nat. Instrum., Austin, TX, USA
Abstract :
Using COTS technology has long been a strategy to mitigate obsolescence management for long life-cycle products. Both test instruments and end users have employed many strategies to meet these product life-cycle demands, which can reach over 25 years for DOD; however few have been able to truly meet the demands while lowering the cost of ownership.
Keywords :
analogue-digital conversion; automatic test equipment; cost reduction; field programmable gate arrays; input-output programs; minimisation; product life cycle management; radiofrequency power amplifiers; virtual instrumentation; COTS technology; RF channel emulator; RF power amplifier test; coined software design; complex mathematical fading models; cost of ownership; digital I/O; digitizers; discrete instruments; hardware cost minimization; lifecycle products; modular I/O; next generation synthetic instrument; obsolescence management mitigation; power leveling algorithm; product lifecycle demand; software designed product; software designed synthetic instrument; test instruments; test time reduction; user programmable FPGA; virtual instruments; Field programmable gate arrays; Hardware; Oscilloscopes; Protocols; Software; Transceivers;
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
DOI :
10.1109/AUTEST.2014.6935169
