Next-generation synthetic instruments

Author

Driver, William

Author_Institution

Automated Test Nat. Instrum., Austin, TX, USA

fYear

2014

fDate

15-18 Sept. 2014

Firstpage

346

Lastpage

349

Abstract

Using COTS technology has long been a strategy to mitigate obsolescence management for long life-cycle products. Both test instruments and end users have employed many strategies to meet these product life-cycle demands, which can reach over 25 years for DOD; however few have been able to truly meet the demands while lowering the cost of ownership.

Keywords

analogue-digital conversion; automatic test equipment; cost reduction; field programmable gate arrays; input-output programs; minimisation; product life cycle management; radiofrequency power amplifiers; virtual instrumentation; COTS technology; RF channel emulator; RF power amplifier test; coined software design; complex mathematical fading models; cost of ownership; digital I/O; digitizers; discrete instruments; hardware cost minimization; lifecycle products; modular I/O; next generation synthetic instrument; obsolescence management mitigation; power leveling algorithm; product lifecycle demand; software designed product; software designed synthetic instrument; test instruments; test time reduction; user programmable FPGA; virtual instruments; Field programmable gate arrays; Hardware; Oscilloscopes; Protocols; Software; Transceivers;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 2014 IEEE

Conference_Location

St. Louis, MO

Print_ISBN

978-1-4799-3389-1

Type

conf

DOI

10.1109/AUTEST.2014.6935169

Filename

6935169