• DocumentCode
    132881
  • Title

    Application of IEEE standards and ATML in TPS development for ministry of defence UK

  • Author

    Kelly, Stephen

  • Author_Institution
    Defence Support Group, MoD Sealand, Deeside, UK
  • fYear
    2014
  • fDate
    15-18 Sept. 2014
  • Firstpage
    350
  • Lastpage
    354
  • Abstract
    The UK MOD has closely monitored and supported the development of IEEE Std 1641 through its Standards Liaison Group for Automatic Test and Standards Technical Working Group for Automatic Test, which meet regularly with UK industry. Feedback from those open meetings is provided as technical input directly to IEEE Standards Coordinating Committee 20 (SCC20). IEEE 1641 and related test standards are key in the pan MOD Policy for ATS. In order to meet the Defence Standards for TPS development a number of projects have been chosen to be developed using the IEEE1641 Standard with ATML to describe the TPS and carry the signal definitions. These projects demonstrate the possibility of full TPS development using standards to industry and lead to feedback that is fed into the aforementioned working groups to create proposals which enhance 1641 and related standards. This paper discusses the main features of the UK MOD Policy for ATS. It explains the significance of 1641 to the Policy and the work undertaken by UK MOD in promoting the standard to UK Industry by describing the function of the working groups and Industrial Liaison Groups. The processes followed to develop a TPS are described and problems and solutions are highlighted. A description of a particular projects TPS development life cycle highlights points at which the development changes from a portable TPS description to a TPS aimed at a particular ATS solution. The paper also discusses the impact of changing TPS development methodology from a long standing and well used method to a new, largely untested method and the reaction from TPS developers when confronted with unfamiliar standards. The cost to benefit ratio is discussed and observations made on the assumption that it is more expensive to develop using the new standards than the current methods utilised within the TPS development department. A summary of other projects in work using the Standards and the proposals in store for future work is given.
  • Keywords
    IEEE standards; XML; automatic test software; military computing; military standards; ATML; ATS; IEEE Standards Coordinating Committee 20; IEEE1641 standard; SCC20; TPS development; TPS development life cycle; UK MOD; UK industry; UK ministry of defence; automatic test mark-up language; cost to benefit ratio; defence standards; pan MOD policy; test program sets; test standards; Committees; IEEE standards; Industries; Instruments; Resource management; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2014 IEEE
  • Conference_Location
    St. Louis, MO
  • Print_ISBN
    978-1-4799-3389-1
  • Type

    conf

  • DOI
    10.1109/AUTEST.2014.6935170
  • Filename
    6935170