Title :
Improved cryogenic sapphire oscillator with exceptionally high frequency stability
Author :
Chang, S. ; Mann, A.G. ; Luiten, A.N.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
fDate :
3/2/2000 12:00:00 AM
Abstract :
Extremely high short term frequency stability has been realised in oscillators based on liquid helium cooled sapphire resonators with a modified mounting structure. These oscillators have exhibited a fractional frequency stability (Allan deviation) of ~5.4×10-16τ½ for integration times (τ) of 1-4s and a minimum Allan frequency deviation of 2.4×10-16 at 32s. For integration times greater than 100s the oscillator frequency stability degrades approximately as 3×10-17τ½. This is the best stability reported to date for any frequency standard over integration times of 1-100s
Keywords :
Q-factor; circuit stability; cryogenic electronics; dielectric resonator oscillators; frequency stability; frequency standards; microwave oscillators; sapphire; 11.9 GHz; 6 K; 7.7 K; Al2O3; cryogenic sapphire oscillator; frequency standard; high frequency stability; integration time; liquid helium cooled resonators; modified mounting structure; oscillator frequency stability; short term frequency stability;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20000338
