DocumentCode
1329338
Title
An Advanced External Compensation System for Active Matrix Organic Light-Emitting Diode Displays With Poly-Si Thin-Film Transistor Backplane
Author
In, Hai-Jung ; Oh, Kyong-Hwan ; Lee, Inhwan ; Ryu, Do-Hyung ; Choi, Sang-Moo ; Kim, Keum-Nam ; Kim, Hye-Dong ; Kwon, Oh-Kyong
Author_Institution
Div. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea
Volume
57
Issue
11
fYear
2010
Firstpage
3012
Lastpage
3019
Abstract
An advanced method for externally compensating the nonuniform electrical characteristics of polycrystalline silicon thin-film transistors (TFTs) and the degradation of organic light-emitting diode (OLED) devices is proposed, and the method is verified using a 14.1-in active matrix OLED (AMOLED) panel. The proposed method provides an effective solution for high-image-quality AMOLED displays by removing IR-drop and temperature effects during the sensing and displaying operations of the external compensation method. Experimental results show that the electrical characteristics of TFTs and OLEDs are successfully sensed, and that the stained image pattern due to the nonuniform luminance error and the differential aging of the OLED is removed. The luminance error range without compensation is from -6.1% to 9.0%, but it is from -1.1% to 1.2% using the external compensation at the luminance level of 120 cd/m2 in a 14.1-inch AMOLED panel.
Keywords
LED displays; elemental semiconductors; organic light emitting diodes; silicon; thin film transistors; AMOLED; Si; active matrix OLED panel; active matrix organic light-emitting diode displays; advanced external compensation system; organic light-emitting diode devices; poly-silicon thin-film transistor backplane; Active matrix organic light emitting diodes; Degradation; Flat panel displays; Light emitting diodes; Sensors; Thin film transistors; Compensation; flat-panel displays; light-emitting diode (LED) displays; thin-film transistors (TFTs);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2067750
Filename
5580066
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