DocumentCode :
1329620
Title :
Exchange Bias in NiFe/IrMn/CoFeB Antidot Arrays
Author :
Chao-Hsien Huang ; Sheng-Yu Lo ; Tian-Chiuan Wu ; Jong-Ching Wu ; Horng, Lance
Author_Institution :
Dept. of Phys. & Taiwan SPIN Res. Center, Nat. Changhua Univ. of Educ., Changhua, Taiwan
Volume :
47
Issue :
10
fYear :
2011
Firstpage :
3494
Lastpage :
3496
Abstract :
A study was made of the exchange bias effect in a structure of SiO2/Ta (5 nm)/NiFe (7 nm)/IrMn (10 nm)/CoFeB (7 nm)/Ta (5 nm) with nanoscale antidot arrays. The nanostructure comprised rhomboid lattice antidot arrays with antidot diameters from 150 to 300 nm and a rhomboid lattice period of 500 nm. Enhancements of exchange bias HEX and coercivity HC were observed in the nanostructure antidot arrays compared to continuous film. These effects were mainly ascribed to the physical limitations on ferromagnetic and antiferromagnetic layers due to the presence of antidots. In antidot arrays, due to the presence of nonmagnetic holes, the ferromagnetic-ferromagnetic interactions in FM layer are reduced, leading to smaller ferromagnetic domains and larger exchange bias with the random-field model. In this paper, the relation between the antidot diameter size and exchange bias was studied.
Keywords :
antiferromagnetic materials; boron alloys; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic materials; iridium alloys; iron alloys; manganese alloys; nanostructured materials; nickel alloys; NiFe-IrMn-CoFeB; antiferromagnetic layers; coercivity; exchange bias; ferromagnetic layers; ferromagnetic-ferromagnetic interactions; nanostructure comprised rhomboid lattice antidot arrays; nonmagnetic holes; random-field model; size 150 nm to 300 nm; Coercive force; Frequency modulation; Lattices; Magnetic hysteresis; Magnetic resonance imaging; Magnetometers; Scanning electron microscopy; Coercive force; exchange interactions; ferromagnetic materials; magnetic hysteresis;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2011.2158526
Filename :
6027667
Link To Document :
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