Title :
Design, Fabrication, and Characterization of a 3-D CMOS Fluxgate Magnetometer
Author :
Chih-Cheng Lu ; Wen-Sheng Huang ; Yu-Ting Liu ; Jen-Tzong Jeng
Author_Institution :
Inst. of Mechatron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
Abstract :
A dual-core 3-D microfluxgate magnetometer fabricated by a simple and inexpensive fabrication process is described in this paper. The microfluxgate is able to operate along a nearly linear V-B relationship at the second harmonic frequency and features good characteristics of high sensitivity and low noise response. These characteristic results indicate a field-to-voltage transfer coefficient of 11 V/T measured at the second harmonic frequency, power consumption of 67.3 mW, and a field noise response less than 12 nT/√ Hz at 1 Hz. In brief, our proposed device not only enhances responsivity capability and linear V-B characteristics, but also is CMOS process compatible, which is considered both function-efficient and cost-effective.
Keywords :
CMOS integrated circuits; fluxgate magnetometers; magnetic cores; magnetic field measurement; magnetic sensors; microsensors; 3-D CMOS microfluxgate magnetometer; field-to-voltage transfer coefficient; frequency 1 Hz; function efficient; high sensitivity; low noise response; magnetic cores; magnetic sensors; power 67.3 mW; power consumption; second harmonic frequency; Amorphous magnetic materials; Coils; Magnetic cores; Magnetic sensors; Magnetometers; Noise; 3-D CMOS microfluxgate; Magnetometers; magnetic field measurement;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2011.2158409