Title :
Comparison of high power semiconductor devices losses in 5MW PMSG MV wind turbines
Author :
Kihyun Lee ; Kyungsub Jung ; Yongsug Suh ; Changwoo Kim ; Hyoyol Yoo ; Sunsoon Park
Author_Institution :
Dept. of Electr. Eng., Chonbuk Nat. Univ., Jeonju, South Korea
Abstract :
This paper provides a comparison of high power semiconductor devices in 5MW-class Permanent Magnet Synchronous Generator (PMSG) Medium Voltage (MV) wind turbines. High power semiconductor devices of IGCT, module type IGBT, press-pack type IGBT, and press-pack type IEGT of both 4.5kV and 6.5kV are considered in this paper. Benchmarking is performed based on neutral point clamped 3-level back-to-back type voltage source converter supplied from grid voltage of 4160V. The feasible number of semiconductor devices in parallel is designed through the loss analysis considering both conduction and switching losses under the given operating conditions of 5MW-class PMSG wind turbines, particularly for the application in offshore wind farms. The loss analysis is confirmed through PLECS simulations. The comparison result shows that press-pack type IGBT and IGCT semiconductor device have the highest efficiency considering the snubber loss of IGCT.
Keywords :
benchmark testing; electronics packaging; insulated gate bipolar transistors; losses; offshore installations; permanent magnet generators; power convertors; power grids; power semiconductor devices; synchronous generators; thyristors; wind turbines; IGCT; PLECS simulations; PMSG MV wind turbines; benchmarking; conduction losses; grid voltage; high power semiconductor devices losses; injection nhanced gate transistor; insulated gate bipolar transistors; integrated gate-commutated thyristors; loss analysis; medium voltage wind turbines; module type IGBT; neutral point clamped voltage source converter; offshore wind farms; permanent magnet synchronous generator; power 5 MW; press-pack type IEGT; press-pack type IGBT; switching losses; three-level back-to-back type voltage source converter; voltage 4.5 kV; voltage 4160 V; voltage 6.5 kV; Insulated gate bipolar transistors; Power conversion; Power semiconductor devices; Switches; Switching loss; Wind turbines;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
Conference_Location :
Fort Worth, TX
DOI :
10.1109/APEC.2014.6803657