DocumentCode :
1330097
Title :
Interconnect Bundle Sizing Under Discrete Design Rules
Author :
Moiseev, Konstantin ; Kolodny, Avinoam ; Wimer, Shmuel
Author_Institution :
Technion - Israel Inst. of Technol., Haifa, Israel
Volume :
29
Issue :
10
fYear :
2010
Firstpage :
1650
Lastpage :
1654
Abstract :
The lithography used for 32 nm and smaller very large scale integrated process technologies restricts the admissible interconnect widths and spaces to a small set of discrete values with some interdependencies, so that traditional interconnect sizing by continuous-variable optimization techniques becomes impossible. We present a dynamic programming (DP) algorithm for simultaneous sizing and spacing of all wires in interconnect bundles, yielding the optimal power-delay tradeoff curve. DP algorithm sets the width and spacing of all interconnects simultaneously, thus finding the global optimum. The DP algorithm is generic and can handle a variety of power-delay objectives, such as total power or delay, or weighted sum of both, power-delay product, max delay, and alike. The algorithm consistently yields 6% dynamic power and 5% delay reduction for interconnect channels in industrial microprocessor blocks designed in 32 nm process technology, when applied as a post-layout optimization step to redistribute wires within interconnect channels of fixed width, without changing the area of the original layout.
Keywords :
VLSI; dynamic programming; integrated circuit interconnections; VLSI; continuous-variable optimization techniques; discrete design rules; dynamic programming algorithm; industrial microprocessor blocks; interconnect bundle sizing; optimal power-delay tradeoff curve; post-layout optimization step; size 32 nm; very large scale integrated process technologies; Algorithm design and analysis; Delay; Heuristic algorithms; Integrated circuit interconnections; Optimization; Resource management; Wires; Dynamic programming (DP); gridded design rules; interconnect sizing and spacing; power-delay optimization;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2051633
Filename :
5580220
Link To Document :
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