Title :
A CMOS high-speed data recovery circuit using the matched delay sampling technique
Author :
Kang, Jin-Ku ; Liu, Wentai ; Cavin, Ralph K., III
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fDate :
10/1/1997 12:00:00 AM
Abstract :
This paper presents a scheme and circuitry for demultiplexing and synchronizing high-speed serial data using the matched delay sampling technique. By simultaneously propagating data and clock signals through two different delay taps, the sampler achieves a very fine sampling resolution which is determined by the difference between the data and clock delays. This high resolution sampling capability of the matched delay sampler can be used in the oversampling data recovery circuit. A data recovery circuit using the matched delay sampling technique has been designed and fabricated in 1.2-μm CMOS technology. The chip has been tested at 417 Mb/s [2.4 ns nonreturn to zero (NRZ)] input data and demultiplexes serial input data into four 104 Mb/s (9.6 ns NRZ) output streams with 800 mW power consumption at 4 V power supply. While recovering data, the sampling clock running at 1/4 of the data frequency is phase-tracking with the input data based on information extracted from a digital phase control circuit
Keywords :
CMOS digital integrated circuits; delay circuits; demultiplexing; signal sampling; synchronisation; 1.2 micron; 4 V; 417 Mbit/s; 800 mW; CMOS high-speed data recovery circuit; NRZ data; clock recovery; demultiplexer; different delay tap; matched delay sampling; serial data; synchronization; CMOS technology; Circuit testing; Clocks; Demultiplexing; Energy consumption; Frequency synchronization; Optical signal processing; Propagation delay; Sampling methods; Signal resolution;
Journal_Title :
Solid-State Circuits, IEEE Journal of