Title :
A morphological estimator for clique potentials of binary Markov random fields
Author :
Sivakumar, Krishnamoorthy ; Goutsias, John
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
fDate :
5/1/2000 12:00:00 AM
Abstract :
The authors consider the problem of estimating the parameters of a binary Markov random field from a given realization. They propose a consistent estimator of the clique potentials that can be implemented by means of morphological erosions. Experimental results demonstrate the effectiveness of the proposed approach.
Keywords :
Markov processes; mathematical morphology; mathematical operators; parameter estimation; signal processing; binary Markov random fields; clique potentials; morphological erosions; morphological estimator; parameter estimation; Image analysis; Image texture analysis; Markov random fields; Maximum likelihood estimation; Monte Carlo methods; Morphological operations; Parameter estimation; Robustness; Stochastic processes; Two dimensional displays;
Journal_Title :
Signal Processing Letters, IEEE
