DocumentCode :
1330837
Title :
Graph Pattern Matching: A Join/Semijoin Approach
Author :
Cheng, Jiefeng ; Yu, Jeffrey Xu ; Yu, Philip S.
Author_Institution :
Dept. of Comput. Sci., Univ. of Hong Kong, Hong Kong, China
Volume :
23
Issue :
7
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
1006
Lastpage :
1021
Abstract :
Due to rapid growth of the Internet and new scientific/technological advances, there exist many new applications that model data as graphs, because graphs have sufficient expressiveness to model complicated structures. The dominance of graphs in real-world applications demands new graph processing techniques to access large data graphs effectively and efficiently. In this paper, we study a graph pattern matching problem, which is to find all patterns in a large data graph that match a user-given graph pattern. We propose new two-step R-join (reachability join) algorithms with a filter step (R-semijoin) and a fetch step (R-join) by utilizing a new cluster-based join index with graph codes in a relational database context. We also propose two optimization approaches to further optimize sequences of R-joins/R-semijoins. The first approach is based on R-join order selection followed by R-semijoin enhancement, and the second approach is to interleave R-joins with R-semijoins. We conducted extensive performance studies, and confirm the efficiency of our proposed new approaches.
Keywords :
Internet; data structures; graph theory; optimisation; pattern matching; relational databases; Internet; R-semijoin enhancement; cluster-based join index; fetch step; graph codes; graph pattern matching; graph pattern matching problem; graph processing techniques; large data graphs; optimization approach; relational database; two-step R-join algorithms; Clustering algorithms; Filtering algorithms; Labeling; Pattern matching; Relational databases; XML; 2-hop labeling; Graph matching; join/semijoin processing.; reachability joins;
fLanguage :
English
Journal_Title :
Knowledge and Data Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
1041-4347
Type :
jour
DOI :
10.1109/TKDE.2010.169
Filename :
5582090
Link To Document :
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