DocumentCode
1330925
Title
An introduction to IC testing
Author
Van Veen, Frederick
Author_Institution
Teradyne, Inc.
Volume
8
Issue
12
fYear
1971
Firstpage
28
Lastpage
37
Abstract
IC testing has evolved from the patterns established some years ago in the production of semiconductors. Since manual testing cannot meet the complex needs indigenous to IC manufacture, highly sophisticated instruments and test systems have developed that are automatically programmed by computer, tape, or printed-circuit card. This article focuses on many of the problems encountered and techniques employed, and also the requirements imposed on automatic IC testing systems.
Keywords
Automatic testing; Circuit testing; Computer aided manufacturing; Instruments; Integrated circuit testing; Production; Semiconductor device testing; Semiconductor diodes; System testing; Test equipment;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/MSPEC.1971.5217887
Filename
5217887
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