DocumentCode
1330942
Title
Comparison of InGaN-Based LEDs Grown on Conventional Sapphire and Cone-Shape-Patterned Sapphire Substrate
Author
Lee, Jae-Hoon ; Lee, Dong-Yul ; Oh, Bang-Won ; Lee, Jung-Hee
Author_Institution
Manuf. Technol. Group, Samsung LED Co., Ltd., Suwon, South Korea
Volume
57
Issue
1
fYear
2010
Firstpage
157
Lastpage
163
Abstract
To improve the external quantum efficiency, a high-quality InGaN/GaN film was grown on a cone-shape-patterned sapphire substrate (CSPSS) by using metal-organic chemical vapor deposition. The surface pattern of the CSPSS seems to be more helpful for the accommodative relaxation of compressive strain related to the lattice mismatch between GaN and a sapphire substrate because the growth mode of GaN on the CSPSS was similar to that of the epitaxial lateral overgrowth. The output power of a light-emitting diode (LED) grown on the CSPSS was estimated to be 16.5 mW at a forward current of 20 mA, which is improved by 35% compared to that of a LED grown on a conventional sapphire substrate. The significant enhancement in output power is attributed to both the increase of the extraction efficiency, resulted from the increase in photon escaping probability due to enhanced light scattering at the CSPSS, and the improvement of the crystal quality due to the reduction of dislocation.
Keywords
III-V semiconductors; MOCVD; compressive strength; dislocations; gallium compounds; indium compounds; light emitting diodes; sapphire; wide band gap semiconductors; InGaN-GaN-Al2O3; compressive strain; compressive stress; cone-shape-patterned sapphire substrate; conventional sapphire; crystal quality; current 20 mA; epitaxial lateral overgrowth; growth mode; lattice mismatch; light emitting diodes; light scattering; metal-organic chemical vapor deposition; photon escaping probability; power 16.5 mW; quantum efficiency; surface pattern; Chemical vapor deposition; Gallium nitride; Lattices; Light emitting diodes; Liquid crystal displays; Optical films; Optical reflection; Photonic crystals; Power generation; Substrates; Compressive stress; GaN; dislocation; external efficiency; light-emitting diode (LED); patterned sapphire;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2009.2034495
Filename
5332359
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