Author_Institution :
National Institute of Standards and Technology (NIST), USA
Abstract :
The application of RFID encompasses a variety of advancing technologies and is continuously evolving. This special topic section on RFID presents a sample of interference issues, and the metrology to improve test methods and procedures necessary to support this evolving technology.
Keywords :
Electromagnetic compatibility; Electromagnetics; Interference; Inventory control; Radiofrequency identification; Standards;
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
DOI :
10.1109/MEMC.2012.6347062
