DocumentCode :
1331056
Title :
Numerical modeling of energy balance equations in quantum well Al xGa1-xAs/GaAs p-i-n photodiodes
Author :
Fardi, Hamid Z. ; Winston, David W. ; Hayes, Russell E. ; Hanna, Mark C.
Author_Institution :
Dept. of Electr. Eng., Colorado Univ., Denver, CO, USA
Volume :
47
Issue :
5
fYear :
2000
fDate :
5/1/2000 12:00:00 AM
Firstpage :
915
Lastpage :
921
Abstract :
The energy balance equations coupled with drift diffusion transport equations in heterojunction semiconductor devices are solved modeling hot electron effects in single quantum well p-i-n photodiodes. The transports across the heterojunction boundary and through quantum wells are modeled by thermionic emission theory. The simulation and experimental current-voltage characteristics of a single p-i-n GaAs/Al xGa1-xAs quantum well agree over a wide range of current and voltage, The GaAs/AlxGa1-xAs p-i-n structures with multi quantum wells are simulated and the dark current voltage characteristics, short circuit current, and open circuit voltage results are compared with the available experimental data, In agreement with the experimental data, simulated results show that by adding GaAs quantum wells to the conventional cell made of wider bandgap Alx Ga1-xAs, short circuit current is improved, but there is a loss of the voltage of the host cell, In the limit of radiative recombination, the maximum power point of an Al0.35Ga0.65As/GaAs p-i-n photodiode with 30-quantum-well periods is higher than the maximum power point of similar conventional bulk p-i-n cells made out of either host Al0.35Ga0.65As or bulk GaAs material
Keywords :
III-V semiconductors; aluminium compounds; dark conductivity; electron-hole recombination; gallium arsenide; hot carriers; p-i-n photodiodes; quantum well devices; semiconductor device models; AlGaAs-GaAs; current-voltage characteristics; dark current voltage characteristics; drift diffusion transport equations; energy balance equations; heterojunction boundary; heterojunction semiconductor devices; host cell; hot electron effects; maximum power point; numerical modeling; open circuit voltage; p-i-n photodiodes; radiative recombination; short circuit current; single quantum well; thermionic emission theory; Circuit simulation; Electrons; Equations; Gallium arsenide; Heterojunctions; Numerical models; PIN photodiodes; Semiconductor devices; Short circuit currents; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.841221
Filename :
841221
Link To Document :
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