Alternating-current thin-film electroluminescent device modeling via SPICE Fowler-Nordheim diode

Author

Bender, J.P. ; Wager, J.F.

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

Volume

47

Issue

5

fYear

2000

fDate

5/1/2000 12:00:00 AM

Firstpage

1113

Lastpage

1115

Abstract

A novel SPICE model is proposed for simulating the electrical characteristics of alternating-current thin-film electroluminescent (ACTFEL) devices. The model consists of two capacitors, representing the top and bottom insulators of the ACTFEL device, connected to a Fowler-Nordheim diode shunted by a resistor, which account for conduction and leakage, respectively, in the ACTFEL phosphor layer. A software interface is developed so that the user may conveniently input the two adjustable model parameters (trap barrier height and phosphor shunt resistance) as well as five parameters corresponding to the physical structure of the ACTFEL device (electron effective mass, device area, insulator capacitance, phosphor thickness, and phosphor dielectric constant). Excellent agreement is obtained between measured and simulated electrical characteristics for evaporated ZnS:Mn ACTFEL devices

Keywords

II-VI semiconductors; SPICE; electroluminescent displays; electron traps; flat panel displays; manganese; phosphors; semiconductor device models; zinc compounds; AC thin-film electroluminescent device modeling; ACTFEL device; SPICE Fowler-Nordheim diode; ZnS:Mn; adjustable model parameters; device area; electrical characteristics; electron effective mass; insulator capacitance; phosphor dielectric constant; phosphor layer; phosphor thickness; shunt resistance; trap barrier height; Capacitors; Diodes; Electric variables; Electroluminescent devices; Electron traps; Insulation; Phosphors; Resistors; SPICE; Thin film devices;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.841248

Filename

841248