Title :
Data-driven self-timed RSFQ high-speed test system
Author :
Deng, Z.J. ; Yoshikawa, N. ; Whiteley, S.R. ; Van Duzer, T.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses. This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test system based on data-driven self-timed (DDST) circuits.
Keywords :
logic testing; superconducting device testing; superconducting logic circuits; 20 Gbit/s; RSFQ logic circuit; data-driven self-timed circuit; on-chip high-speed digital testing; Automatic testing; Circuit testing; Clocks; Life testing; Logic testing; Pulse circuits; Shift registers; System testing; System-on-a-chip; Timing;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
