• DocumentCode
    1331376
  • Title

    High Coercivity FePtSiN Films With L1 _{0} –FePt Nanoparticles Embedded in a Si-Rich Matrix

  • Author

    Lei Ma ; Liu, Z.W. ; Yu, H.Y. ; Zhong, X.C. ; Zeng, Y.P. ; Zeng, D.C. ; Zhong, X.P.

  • Author_Institution
    Dept. of Metallic Mater. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
  • Volume
    47
  • Issue
    10
  • fYear
    2011
  • Firstpage
    3505
  • Lastpage
    3508
  • Abstract
    FePtSiN films consisting of FePt nanoparticles embedded in Si-rich matrix were fabricated on silicon substrates by direct current (dc) reactive magnetron sputtering followed by vacuum annealing. The effects of Si-N additions and annealing temperature on the structure and magnetic properties were investigated. The as-deposited films had face-centered cubic (fcc) structure, which transforms into the face-centered tetragonal (fct) structure after thermal annealing at 600°C. The grain size of FePt increased with the annealing temperature but decreased with increasing Si-N content. Increasing Si content led to the formation of Si-N-rich amorphous phase distributed between the FePt nanograins, which reduced the lattice distortion and increased the coercivity. The fct-FePt films annealed at 700°C exhibited very high coercivity, up to 13.6 kOe at room temperature and about 17.5 kOe at 100 K. These FePtSiN films have shown promise for high-density magnetic recording medium.
  • Keywords
    annealing; coercive force; elemental semiconductors; grain size; iron alloys; iron compounds; magnetic thin films; nanomagnetics; nanoparticles; platinum alloys; platinum compounds; silicon; silicon compounds; sputter deposition; FePtSiN-FePt-Si; L10-FePt nanoparticles; Si; Si-rich matrix; amorphous phase; annealing temperature; as-deposited films; direct current reactive magnetron sputtering; face-centered cubic structure; face-centered tetragonal structure; grain size; high coercivity films; high-density magnetic recording medium; lattice distortion; nanograins; silicon substrates; temperature 100 K to 973 K; temperature 293 K to 298 K; thermal annealing; vacuum annealing; Amorphous magnetic materials; Annealing; Coercive force; Iron; Lattices; Magnetic recording; Silicon; FePt thin films; magnetic recording; magnetron sputtering; nanocomposite magnet;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2147772
  • Filename
    6028057